DocumentCode
3537310
Title
The analysis fraktal characteristics of microscopic objects with WTMM method application
Author
Volkov, Y.P. ; Bespalova, N.V. ; Khorovodova, N.Y.
Author_Institution
Saratov State Tech. Univ., Saratov, Russia
fYear
2012
fDate
19-20 Sept. 2012
Firstpage
422
Lastpage
425
Abstract
Article is devoted to research of fractal characteristics of microscopic objects with WTMM method application. The assessment of multifractal of studied images of surfaces is carried out.
Keywords
fractals; object detection; wavelet transforms; WTMM method; fractal characteristics; microscopic object; multifractal assessment; surface image; Microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4673-2096-2
Type
conf
DOI
10.1109/APEDE.2012.6478093
Filename
6478093
Link To Document