• DocumentCode
    3537491
  • Title

    Magnetic and electronic properties of Fe1.2Ti0.8O3/Fe2O3 bilayered films

  • Author

    Fujii, Tatsuo ; Takada, Yusuke ; Nakanishi, Masaki ; Takada, Jun

  • Author_Institution
    Dept. of Appl. Chem., Okayama Univ., Japan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1455
  • Lastpage
    1456
  • Abstract
    Bilayered films of Fe1.2Ti0.8O3/Fe2O3 were prepared on α-Al2O3(001) single-crystalline substrate using reactive sputtering technique. The magnetic and electronic properties of the films were characterized by X-ray diffraction (XRD), conversion electron Mossbauer spectroscopy (CEMS), vibrating sample magnetometer (VSM) and X-ray photoelectron spectroscopy (XPS).
  • Keywords
    Mossbauer effect; X-ray diffraction; X-ray photoelectron spectra; ferrimagnetic materials; interface magnetism; iron compounds; magnetic thin films; sputter deposition; Al2O3; Fe1.2Ti0.8O3-Fe2O3; VSM; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; bilayered films; conversion electron Mossbauer spectroscopy; electronic properties; magnetic properties; reactive sputtering technique; vibrating sample magnetometer; Iron; Magnetic films; Magnetic properties; Magnetization; Semiconductor films; Solid state circuits; Temperature; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464157
  • Filename
    1464157
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3537491