Magnetic domain structure of micro-patterned PtMn/NiFe exchange bias bilayers

Author

Potzger, K. ; Bischoff, L. ; Liedke, M.O. ; Hillebrands, B. ; Rickart, M. ; Freitas, P. ; McCord, J. ; Fassbender, J.

Author_Institution

Inst. fur Ionenstrahlphysik und Materialforschung, Dresden, Germany

fYear

2005

fDate

4-8 April 2005

Firstpage

1525

Lastpage

1526

Abstract

The magnetic domain structure of the micropatterned PtMn/NiFe exchange bias bilayers during magnetization reversal prepared by ion beam and physical vapor deposition were investigated. Using magneto-optic Kerr effect magnetometry (MOKE) and Kerr microscopy, the magnetic properties of the stripe array created using a 25 keV Ga⁺ focused ion beam (FIB) were also analyzed.

Keywords

Kerr magneto-optical effect; exchange interactions (electron); focused ion beam technology; ion beam assisted deposition; iron alloys; magnetic domains; magnetic thin films; magnetisation reversal; manganese alloys; micromagnetics; nickel alloys; platinum alloys; 25 keV; Kerr microscopy; MOKE; PtMn-NiFe; focused ion beam; ion beam deposition; magnetic domain structure; magnetic properties; magnetization reversal; magneto-optic Kerr effect magnetometry; micropatterned exchange bias bilayers; physical vapor deposition; stripe array; Amorphous magnetic materials; Ion beams; Magnetic domains; Magnetic fields; Magnetic force microscopy; Magnetic materials; Magnetic properties; Magnetic separation; Saturation magnetization; Soft magnetic materials;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464194

Filename

1464194