Structure and ATR properties of spiropyran LB ultrathin films

Author

Okuchi, W. ; Saiki, H. ; Shinbo, K. ; Wakamatsu, T. ; Kato, K. ; Kaneko, F.

Author_Institution

Dept. of Electr. & Electron. Eng., Niigata Univ., Japan

fYear

1995

fDate

17-20 Sep 1995

Firstpage

327

Lastpage

330

Abstract

The attenuated total reflection (ATR) properties and the structures were investigated for Langmuir-Blodgett (LB) ultrathin films of the photochromic dye spiropyran (SP) on Ag and Al coated glasses. The ATR properties strongly depended upon the number of the monolayers of the LB films on the substrates. The theoretical ATR curves were calculated assuming the dielectric constants, and they agreed with the experimental results. The thicknesses were deduced from curve fitting. It is considered that the SP LB films on the Ag films were probably deposited partly in piles, and that the deposition of the photomerocyanine (PMC) form was stabler than that of the SP forms. The changes of the ATR properties caused by UV irradiation and heat treatments were also observed

Keywords

Langmuir-Blodgett films; optical films; organic compounds; photochromism; reflectivity; Langmuir-Blodgett ultrathin films; UV irradiation; attenuated total reflection; curve fitting; dielectric constants; heat treatment; monolayers; optical properties; photochromic dye; photomerocyanine; spiropyran; structure; Artificial intelligence; Dielectric constant; Dielectric thin films; Educational institutions; Electromagnetic wave absorption; Glass; Optical attenuators; Optical films; Optical refraction; Optical variables control;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulating Materials, 1995. International Symposium on

Conference_Location

Tokyo

Print_ISBN

4-88686-047-8

Type

conf

DOI

10.1109/ISEIM.1995.496575

Filename

496575