Planar stochastic sources localization algorithm in EMC problems

Author

Baev, Andrey ; Gorbunova, Anastasia ; Konovalyuk, Maxim ; Kuznetsov, Yury ; Russer, Johannes A.

Author_Institution

Theor. Radio Eng. Dept., Moscow Aviation Inst., Moscow, Russia

fYear

2013

fDate

9-13 Sept. 2013

Firstpage

440

Lastpage

443

Abstract

A two dimensional localization algorithm for stochastic EMI sources based on time domain measurements of electromagnetic near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The simulation and experimental data are processed for a spatial localization of equivalent point sources. The estimated field distributions and patterns are presented.

Keywords

correlation methods; electromagnetic compatibility; electromagnetic interference; statistical distributions; stochastic processes; time-domain analysis; EMC problems; autocorrelation functions; cross-correlation functions; electromagnetic near-field tangential components; equivalent point sources; field distribution estimation; planar stochastic sources localization algorithm; spatial localization; stochastic EMI sources; stochastic field distribution; time domain measurements; two dimensional localization algorithm; two-point planar scanning system; Correlation; Electromagnetic interference; Estimation; Frequency-domain analysis; Stochastic processes; Time-domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on

Conference_Location

Torino

Print_ISBN

978-1-4673-5705-0

Type

conf

DOI

10.1109/ICEAA.2013.6632275

Filename

6632275