DocumentCode
3540089
Title
Signal-power integrity and EMI analysis for singlechip and multi-chip-module applications
Author
Wane, S. ; Erdem, A Tanju ; le Grontec, A. ; Tesson, O. ; Bardy, Serge ; Kloczkowski, Robert ; Abessolo, Dolphin ; Mattheijssen, Paul
Author_Institution
NXP Semicond. Caen, Caen, France
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
992
Lastpage
995
Abstract
In this paper, a global Chip-Package-PCB Co-Design and Co-Verification methodology is successfully applied to Single-Chip Down-converter circuit and Multi-Chip-Module in transmit mode. Full-wave electromagnetic and thermal Co-Analysis approach is adopted to investigate impact of critical RF couplings, power dissipation and grounding strategies on systemlevel performances. The Single-Chip down-converter circuit shows 43dB conversion gain, with 6.5dB noise figure and output IP3 of 18dBm. The MCM design demonstrates 35dBm output IP3, 25dBm output CP1, with 45dB image rejection with 25dB voltage gain for a dissipated power of 2.2W.
Keywords
chip scale packaging; chip-on-board packaging; convertors; electromagnetic interference; multichip modules; printed circuits; EMI analysis; co-verification methodology; critical RF couplings; full-wave electromagnetic method; gain 43 dB; global chip-package-PCB co-design; grounding strategies; multichip-module; noise figure 6.5 dB; power 2.2 W; power dissipation; signal-power integrity; single-chip down-converter circuit; system-level performances; thermal co-analysis; transmit mode; Electromagnetic interference; Electrostatic discharges; Grounding; Radio frequency; Satellite broadcasting; Satellites; Solid modeling; Chip-Package-PCB Co-Design; EM couplings; MCM; Power-Signal Integrity; Thermal Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4673-5705-0
Type
conf
DOI
10.1109/ICEAA.2013.6632389
Filename
6632389
Link To Document