A robust hardwired interwoven fault-masking technique

The process technology scales below 100 nanometers at present. Such miniaturizations of components has created reliability-threats to the designers, specially in the case of critical or semi-critical systems, whose failures can bring catastrophes in terms of human or great financial losses. Reliable working of such be ensured. In this paper, first the causes of such reliability-threats have been discussed and then a robust fault-masking technique has been presented to improve the reliability of a system. The technique presented restricts a system, even to generate momentary errors.