• DocumentCode
    3541342
  • Title

    Joint deconvolution/segmentation of microscope images of materials

  • Author

    Kim, Dae Woo ; Comer, Mary L.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    688
  • Lastpage
    691
  • Abstract
    In this paper, we propose the joint deconvolution and segmentation of materials images by incorporating blurring information in the EM/MPM segmentation algorithm. In the segmentation of microscope images of materials, exact boundary precision is very important. But it is difficult to get good results if the images have some degradation obtained in the acquisition process. We incorporate prior knowledge of blurring degradation into the existing EM/MPM segmentation algorithm in order to improve segmentation results at object boundaries. Experimental results using materials datasets are presented to demonstrate the proposed method is effective for that purpose.
  • Keywords
    deconvolution; image segmentation; EM-MPM segmentation algorithm; acquisition process; blurring information; materials images; microscope images deconvolution; microscope images segmentation; Algorithm design and analysis; Deconvolution; Degradation; Image segmentation; Materials; Microscopy; Signal processing algorithms; EM/MPM algorithm; Segmentation; deconvolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Signal Processing Workshop (SSP), 2012 IEEE
  • Conference_Location
    Ann Arbor, MI
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-0182-4
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/SSP.2012.6319795
  • Filename
    6319795