DocumentCode
3546001
Title
Error bars in intensity and phase measurements of ultrashort laser pulses
Author
Munroe, M. ; Christensen, D.H. ; Trebino, Rick
Author_Institution
Div. of Optoelectron., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
1998
fDate
3-8 May 1998
Firstpage
462
Lastpage
463
Abstract
Summary form only given. It is now possible to measure a pulse´s intensity and phase versus time. The most commonly used method, frequency-resolved optical gating (FROG), generates the full pulse intensity and phase versus time without making any assumptions about the pulse. As a result, it is potentially accurate, limited only by the accuracy of the measured trace. Just how accurate is a given FROG measurement of a pulse. Some indication of the measured pulse accuracy is available from the FROG error-the rms difference between the measured and retrieved FROG traces. However, a method for determining the error in each of the retrieved intensity and phase points is needed. In other words, we need to be able to place error bars on the intensity and phase at each time (and frequency). We present a simple, robust, and general method for doing this. We apply this method to both theoretical and experimental FROG measurements of pulses and show that it gives reasonable results.
Keywords
laser variables measurement; measurement errors; measurement uncertainty; phase measurement; statistical analysis; FROG; error bars; frequency-resolved optical gating; full pulse intensity; intensity measurements; laser pulse intensity; measured pulse accuracy; measured trace accuracy; phase measurements; phase points; retrieved FROG traces; retrieved intensity; rms difference; ultrashort laser pulses; Autocorrelation; Bandwidth; Bars; Optical pulses; Phase measurement; Pulse compression methods; Pulse measurements; Pulse shaping methods; Shape measurement; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-339-0
Type
conf
DOI
10.1109/CLEO.1998.676499
Filename
676499
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