• DocumentCode
    3546035
  • Title

    Postgrowth tuning of cavity resonance for multiple-wavelength laser and detector arrays

  • Author

    Fiore, A. ; Akulova, Y.A. ; Hegblom, E.R. ; Ko, J. ; Coldren, L.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    467
  • Lastpage
    468
  • Abstract
    Summary form only given. Multiple-wavelength arrays of vertical-cavity lasers (VCLs) and detectors are important for wavelength-division-multiplexing systems. In-plane variation of the cavity resonant wavelength usually requires growth on patterned substrates or two successive growths and a complicated processing. It was recently observed that the lateral wet oxidation of an AlGaAs layer can result in partial vertical oxidation of an adjacent layer. We propose to use this combined lateral-vertical oxidation to change the optical thickness of a cavity after the epitaxial growth of both Bragg mirrors.
  • Keywords
    aluminium compounds; laser cavity resonators; laser mirrors; laser tuning; optical fabrication; optical transmitters; oxidation; semiconductor growth; semiconductor laser arrays; surface emitting lasers; AlGaAs; AlGaAs layer; Bragg mirrors; adjacent layer; cavity resonance; cavity resonant wavelength; combined lateral-vertical oxidation; detector arrays; epitaxial growth; lateral wet oxidation; multiple-wavelength laser; multiple-wavelength semiconductor laser arrays; optical thickness; partial vertical oxidation; patterned substrates; postgrowth tuning; wavelength-division-multiplexing systems; Apertures; Atomic force microscopy; Current density; Laser tuning; Light emitting diodes; Optical arrays; Radiative recombination; Resonance; Sensor arrays; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676505
  • Filename
    676505