• DocumentCode
    3546868
  • Title

    High voltage SOI VLD PMOS with charge-balanced surface super junction layer

  • Author

    Ming Qiao

  • Author_Institution
    No.58 Res. Inst., China Electron. Technol. Group Corp., Wuxi, China
  • Volume
    2
  • fYear
    2013
  • fDate
    15-17 Nov. 2013
  • Firstpage
    366
  • Lastpage
    369
  • Abstract
    A novel high voltage SOI VLD (Variation of Lateral Doping) PMOS, which has a charge-balanced surface super junction (SJ) layer, is proposed. VLD layer yields an enhanced spread of space charge region to sustain the applied high voltage during the forward blocking mode. Charge balance and maximum breakdown voltage (BV) occur when the doping concentration of the p pillars is slightly higher than that of the n pillars. Further reduction of specific on-resistance (Ron, sp) for a given BV is achieved by utilizing high aspect ratio surface SJ pillars. Simulation results show that the proposed PMOS with Ld=35 μm and NA=ND=1E17 cm-3 can achieve a BV of 582 V and Ron, sp of 210 mΩ·cm2, leading to a power figure of merit (FOM) of 1.6 MW·cm-2.
  • Keywords
    MOS integrated circuits; electric breakdown; impurity distribution; power integrated circuits; semiconductor doping; silicon-on-insulator; space charge; charge balanced surface super junction layer; charge-balanced surface super junction layer; doping concentration; enhanced spread; forward blocking mode; high voltage SOI VLD PMOS; maximum breakdown voltage; space charge region; variation of lateral doping PMOS; Avalanche breakdown; Doping; Electric fields; Junctions; Silicon-on-insulator; Simulation; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-3050-0
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2013.6765358
  • Filename
    6765358