Transport in photorefractive thin films

Author

Wang, Q.N. ; Temple, D.A.

Author_Institution

Res. Center for Opt. Phys., Hampton Univ., VA, USA

fYear

1996

fDate

2-7 June 1996

Firstpage

258

Abstract

Summary form only given. Thin-film photorefractive gratings in the transverse field geometry have been studied extensively. Usually, one-dimensional transport equations were used to predict its device performance. However, the thin film edge effects were shown significant by Aguilar et al. (1995) recently, which indicates the important role of the 2D nature of the device. In this summary, we propose a new model which includes the thin thickness effect and shows the qualitative difference between the two-dimensional structure and its 3D counterpart.

Keywords

dielectric devices; dielectric thin films; diffraction gratings; optical films; photorefractive effect; thin film devices; device performance; one-dimensional transport equations; photorefractive gratings; photorefractive thin films; thin film edge effects; thin thickness effect; three-dimensional structure; transverse field geometry; two-dimensional structure; Gratings; Nonlinear optics; Optical films; Optical scattering; Particle scattering; Photorefractive effect; Physics; Poisson equations; Thin film devices; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864640