Quality distribution and yield theory for diode laser fabrication

Author

Wu, Yimin A. ; Chang-Hasnain, Connie J.

Author_Institution

Edward L. Ginzton Lab., Stanford Univ., CA, USA

fYear

1996

fDate

2-7 June 1996

Firstpage

360

Abstract

Summary form only given. The ability to understand predict, and interpret fabrication yield is extremely important for efficient and cost-effective manufacturing. Here, we present a yield theory derived from simple fundamental equations. This theory is compared with a large number of sets of experimental data, including threshold current, voltage, and wavelength distributions of both vertical-cavity surface-emitting lasers (VCSELs) and edge-emitting lasers.

Keywords

laser cavity resonators; laser theory; optical fabrication; probability; quality control; semiconductor device models; semiconductor lasers; semiconductor technology; surface emitting lasers; cost-effective manufacturing; diode laser fabrication; edge-emitting lasers; fabrication yield; quality distribution; simple fundamental equations; threshold current; vertical-cavity surface-emitting lasers; voltage; wavelength distributions; yield theory; Diode lasers; Equations; Laser theory; Manufacturing; Optical device fabrication; Surface emitting lasers; Surface waves; Threshold current; Threshold voltage; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864788