• DocumentCode
    3550688
  • Title

    Distributed diagnosis under bounded-delay communication of immediately forwarded local observations

  • Author

    Qiu, Wenbin ; Kumar, Ratnesh

  • Author_Institution
    Dept. of Elec. & Comp. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2005
  • fDate
    8-10 June 2005
  • Firstpage
    1027
  • Abstract
    In this paper, we study distributed failure diagnosis under k-bounded communication delay, where each local site transmits its observations to other sites immediately after each observation, and which is received within at most k more event executions of the plant. This work extends our prior work on decentralized failure diagnosis that did not allow any communication among the local sites. A notion of joint diagnosability is introduced so that any failure can be diagnosed within a bounded delay of its occurrence by one of the local sites using its own observations and the k-bounded delayed observations received from other local sites. The local sites communicate among each other using an "immediate observation passing (iop)" protocol, forwarding any observation immediately up on its occurrence. We construct models for k-bounded communication delay, and use them to extend the system and non-fault specification models for capturing the effect of bounded-delay communication. Using the extended system and specification models, the distributed diagnosis problem under the immediate observation passing protocol is then converted to a decentralized diagnosis problem. Results from [W. Qiu and R. Kumar, 2004] are applied for verifying jointk iop-diagnosability, and for synthesizing local diagnosers. Methods by which complexity of testing jointk iop-diagnosability and of on-line diagnosis can be reduced are presented.
  • Keywords
    delays; discrete event systems; fault diagnosis; decentralized diagnosis problem; distributed failure diagnosis; forwarded local observations; immediate observation passing; k-bounded-delay communication; Circuit faults; Delay effects; Diagnostic expert systems; Discrete event systems; Fault diagnosis; Neural networks; Power system modeling; Predictive models; Protocols; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2005. Proceedings of the 2005
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-9098-9
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2005.1470095
  • Filename
    1470095