• DocumentCode
    355180
  • Title

    Optical output degradation of II-VI blue-green light emitting diodes

  • Author

    Chuang, Shun L. ; Ukita, M. ; Kijima, Shuji ; Taniguchi, Shinji ; Ishibashi, A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1996
  • fDate
    2-7 June 1996
  • Firstpage
    455
  • Abstract
    Summary form only given. Room-temperature continuous-wave operation of II-VI blue-green laser diodes has been possible with a lifetime exceeding an hour. Some major problems limiting a long life-time for II-VI blue-green lasers are a high pre-existing defect density and the growth of defect density during laser operation. Recently, we proposed a theoretical model with an analytical solution for the degradation mechanism of II-VI LEDs based on the carrier-recombination-enhanced defect generation. In this paper we compare this model with experimental results on a CdZnSe LED.
  • Keywords
    II-VI semiconductors; cadmium compounds; electron-hole recombination; light emitting diodes; zinc compounds; CdZnSe; II-VI blue-green light emitting diode; carrier-recombination-enhanced defect generation; lifetime; optical output degradation; room-temperature continuous-wave operation; Aging; Degradation; Diode lasers; Equations; Laser modes; Laser theory; Light emitting diodes; Power generation; Radiative recombination; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-55752-443-2
  • Type

    conf

  • Filename
    864917