Fabrication of a rugged, low-peak current high-speed tunnel diode

A major problem of high-speed tunnel diodes has been poor reliability due to fragility of the very small area junctions needed for low capacitance. This paper describes a solution to the problem, based upon building a mechanical support very close to the junction. Important factors in the selection of the geometry of the supporting structure are discussed. Two general fabrication methods are presented and compared. Electrical and mechanical characteristics and short-term reliability test results are given for diodes made by the processes described.