DocumentCode
3553021
Title
Device characterization for YIG tuned bulk microwave oscillator
Author
Kennedy, W.K. ; Kunz, W.E.
Volume
15
fYear
1969
fDate
1969
Firstpage
42
Lastpage
42
Abstract
Both avalanche (IMPATT) and GaAs devices have been investigated for electronically tuned oscillators at C-, X-, and Ku-band. Models for each type of device have been formulated, and excellent experimental agreement obtained with the computer simulations as far as output power, bandwidth, and detail of the power-frequency characteristic. This paper will discuss device equivalent circuits for each type of device and present experimental data to both substantiate the model and establish element values. This is the first time that equivalent circuits for these devices have been verified by wide-band electronic tuning. With 6 dB of power loss from the optimum device performance in waveguide circuits, bandwidths of 2 GHz at X-band have been obtained with avalanche devices. Under identical conditions, 5 GHz of bandwidth at X-band have been obtained with bulk GaAs devices. To further establish the frequency characteristics of these devices, identical devices have been operated in X- and Ku-band circuits. Element values for both of the device equivalent circuits have thus been verified from 7 to 18 GHz as a function of doping concentrations and device geometry.
Keywords
Bandwidth; Circuit optimization; Computer simulation; Equivalent circuits; Gallium arsenide; Microwave devices; Microwave oscillators; Performance loss; Power generation; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1969 International
Type
conf
DOI
10.1109/IEDM.1969.188105
Filename
1475986
Link To Document