Evaluation of PbSnTe detector fabrication procedures

The PbSnTe alloy is used to fabricate infra-red detectors that are sensitive over the spectral range from 3 to 14 microns. Electronic characteristics of these detectors are very sensitive to fabrication procedures and in order to optimize detector performance, it is necessary to determine the effects of the various processing steps. In this paper, a technique is described for the examination of PbSnTe after fabrication procedures by using an Auger Electron Spectrometer. Data is presented correlating surface treatment of PbSnTe with final device performance.