• DocumentCode
    3554197
  • Title

    Up-diffused I2L, a high speed bipolar LSI process

  • Author

    McGreivy, Denis J. ; Roesner, Bruce B.

  • Author_Institution
    Hughes Aircraft Company, Newport Beach, California
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    308
  • Lastpage
    311
  • Abstract
    I2L (Integrated Injection Logic) or MTL (Merged Transistor Logic) is generally considered a low power, medium speed logic technology with high packing density. The standard double diffused structures presently used cannot yield the high speeds necessary for many circuits. However, improvements in the NPN transistor doping profile by "up-diffusing" a buried layer P base during N epi growth have greatly increased the speed of I2L circuits. Also, fan out and drive capabilities are improved since transistors fabricated with this process yield betas of over 200 and breakdown voltages of 7 to 10 volts. This compares to standard I2L transistors with betas of 10 and breakdown voltages of 4 volts. Further advantages of the up-diffused I2L are the ease with which Schottky diodes (both for isolation and collector base clamps) and oxide isolation can be incorporated. Junction isolated devices with standard 5 micron geometries yield minimum gate delays of 2.4 nsecs and typical minimum power-delay products of under 0.2 pJ.
  • Keywords
    Aircraft; Breakdown voltage; Clamps; Delay; Doping profiles; Integrated circuit technology; Large scale integration; Logic; Schottky diodes; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.189044
  • Filename
    1478756