DocumentCode
3554486
Title
A complementary-pair of high-power MOSFET´s
Author
Okabe, Takeaki ; Yoshida, Isao ; Ochi, Shikayuki ; Nagata, Minoru
Author_Institution
Hitachi Ltd., Tokyo, Japan
Volume
23
fYear
1977
fDate
1977
Firstpage
416
Lastpage
419
Abstract
A complementary pair of high power MOSFETs is developed, each of which has a drain breakdown voltage as high as 200V and 10A current capabilities. This device has an offset gate and an ion-implanted additional channel to realize this high breakdown voltage. The device structure including the use of a field plate, is optimized by two dimensional MOS analysis. This design and a highly refined polysilicon gate fabrication process contribute to the realization of the high power devices. Measurement of these devices reveals superior thermal characteristic and assures a larger ASO than that of conventional bipolar transistors of the same chip size.
Keywords
Bipolar transistors; Breakdown voltage; Electric resistance; Fabrication; Laboratories; MOSFETs; Power transistors; Semiconductor device measurement; Silicon; Size measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1977 International
Type
conf
DOI
10.1109/IEDM.1977.189275
Filename
1479355
Link To Document