• DocumentCode
    3554486
  • Title

    A complementary-pair of high-power MOSFET´s

  • Author

    Okabe, Takeaki ; Yoshida, Isao ; Ochi, Shikayuki ; Nagata, Minoru

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    23
  • fYear
    1977
  • fDate
    1977
  • Firstpage
    416
  • Lastpage
    419
  • Abstract
    A complementary pair of high power MOSFETs is developed, each of which has a drain breakdown voltage as high as 200V and 10A current capabilities. This device has an offset gate and an ion-implanted additional channel to realize this high breakdown voltage. The device structure including the use of a field plate, is optimized by two dimensional MOS analysis. This design and a highly refined polysilicon gate fabrication process contribute to the realization of the high power devices. Measurement of these devices reveals superior thermal characteristic and assures a larger ASO than that of conventional bipolar transistors of the same chip size.
  • Keywords
    Bipolar transistors; Breakdown voltage; Electric resistance; Fabrication; Laboratories; MOSFETs; Power transistors; Semiconductor device measurement; Silicon; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1977 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1977.189275
  • Filename
    1479355