• DocumentCode
    3555015
  • Title

    Virtual phase CCD technology

  • Author

    Hynecek, J.

  • Volume
    25
  • fYear
    1979
  • fDate
    1979
  • Firstpage
    611
  • Lastpage
    614
  • Abstract
    In this article a new concept of a single phase CCD, called "virtual phase", is described. Virtual phase technology employs only a single level gate electrode structure. This technology represents a new approach to fabrication of large area CCD devices which have both high performance and high yield. An example of the application of virtual phase technology to the fabrication of a 490 × 328 CCD imager is presented, and several important design and performance parameters are discussed.
  • Keywords
    Charge coupled devices; Clocks; Doping; Electrodes; Electrons; Fabrication; Implants; Instruments; Potential well; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1979 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1979.189698
  • Filename
    1480563