• DocumentCode
    3555212
  • Title

    Electrical-optical characteristics of buried waveguide heterostructure InGaAsP injection lasers

  • Author

    Wilson, R.B. ; Nelson, R.J. ; Wright, P.D.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    370
  • Lastpage
    373
  • Abstract
    The fabrication procedure, electrical properties, and optical characteristics of InGaAsP buried-waveguide-heterostructure (BWH) lasers emitting at γ = 1.3 µm are described and compared with InGaAsP buried heterostructure (BH) and strip-buried heterostructure (SBH) lasers. Threshold currents as low as 140 mA have been achieved for the BWH structure which incorporates a high band gap quaternary waveguide layer adjacent to the active layer stripe. Measurements of the variation of the near-field and far-field patterns with stripe width indicate that the BWH device will operate in the fundamental transverse mode for stripe widths up to 5 µm.
  • Keywords
    Etching; Indium phosphide; Laser modes; Leakage current; Optical device fabrication; Optical waveguides; Stimulated emission; Surface emitting lasers; Threshold current; Waveguide lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189840
  • Filename
    1481283