• DocumentCode
    3555240
  • Title

    GaAs planar doped barriers by molecular beam epitaxy

  • Author

    Malik, R.J. ; Board, K. ; Eastman, L.F. ; Wood, C.E.C. ; Aucoin, T.R. ; Ross, R.L. ; Savage, R.O.

  • Author_Institution
    U.S. Army Electronics Technology & Devices Laboratory, Fort Monmouth, NJ, USA
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    456
  • Lastpage
    459
  • Abstract
    A new majority carrier rectifying barrier device designated as a "planar-doped barrier" (PDB) has been fabricated in GaAs by MBE. The key feature of the PDB structure is that the barrier height and degree of asymmetry in the I-V characteristics can be continuously and independently controlled. In addition, the barrier can be designed to yield a constant capacitance. Experimental I-V characteristics agree well with a thermionic emission model. This planar-doped-barrier concept offers significant advantages over Schottky barriers and may, in fact, evolve into a new generic class of barrier devices.
  • Keywords
    Capacitance; Gallium arsenide; Laboratories; Molecular beam epitaxial growth; Region 1; Schottky barriers; Schottky diodes; Semiconductor diodes; Space charge; Thermionic emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189865
  • Filename
    1481308