• DocumentCode
    3555301
  • Title

    Effects of gate structure on static induction thyristor

  • Author

    Nishizawa, Jun-ichi ; Ohtsubo, Yoshinobu

  • Author_Institution
    Tohoku University, Sendai, Japan
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    658
  • Lastpage
    661
  • Abstract
    Basic characteristics of static induction thyristor have been discussed experimentally by fabricating buried diffused gate structure devices having various gate to gate spacing. The decrease of the gate to gate spacing increases a forward voltage blocking gain. Here the forward voltage blocking gain is varied from 10 to 700. The gate turn-off current increases continuously with increasing the forward voltage blocking gain, while the forward voltage drop is kept almost constant for the variation of the forward voltage blocking gain from 10 to 700. Switching speed is optimized at a certain forward voltage blocking gain such as 300 to 500.
  • Keywords
    Anodes; Breakdown voltage; Cathodes; Charge carrier processes; Current density; Impurities; Low voltage; Semiconductor diodes; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189920
  • Filename
    1481363