DocumentCode
3555301
Title
Effects of gate structure on static induction thyristor
Author
Nishizawa, Jun-ichi ; Ohtsubo, Yoshinobu
Author_Institution
Tohoku University, Sendai, Japan
Volume
26
fYear
1980
fDate
1980
Firstpage
658
Lastpage
661
Abstract
Basic characteristics of static induction thyristor have been discussed experimentally by fabricating buried diffused gate structure devices having various gate to gate spacing. The decrease of the gate to gate spacing increases a forward voltage blocking gain. Here the forward voltage blocking gain is varied from 10 to 700. The gate turn-off current increases continuously with increasing the forward voltage blocking gain, while the forward voltage drop is kept almost constant for the variation of the forward voltage blocking gain from 10 to 700. Switching speed is optimized at a certain forward voltage blocking gain such as 300 to 500.
Keywords
Anodes; Breakdown voltage; Cathodes; Charge carrier processes; Current density; Impurities; Low voltage; Semiconductor diodes; Thyristors; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1980 International
Type
conf
DOI
10.1109/IEDM.1980.189920
Filename
1481363
Link To Document