DocumentCode
3555435
Title
Degradation of EM shielding effectiveness due to resonance in the low frequency region
Author
Seki, Yasuo ; Nitta, Shuichi
Author_Institution
Fac. of Technol., Tokyo Univ. of Agric. & Technol., Japan
fYear
1991
fDate
12-16 Aug 1991
Firstpage
109
Lastpage
113
Abstract
The degradation mechanism of shielding effectiveness in the low frequency range, which cannot be understood from the waveguide model, is clarified. The extreme points in the quasi-near field are shown on an intrinsic impedance characteristics curve and the resonance phenomena on extreme points, and it is proven experimentally and statistically that the remarkable degradation of shielding effectiveness at these resonance points occurs in the shielded enclosures
Keywords
electric field measurement; electric impedance measurement; magnetic field measurement; magnetic shielding; resonance; EM shielding effectiveness; degradation mechanism; impedance characteristics; low frequency region; quasi-near field; resonance; shielded enclosures; Antenna measurements; Degradation; Electromagnetic measurements; Electromagnetic shielding; Electromagnetic waveguides; Impedance; Magnetic field measurement; Resonance; Resonant frequency; Waveguide theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-7803-0158-7
Type
conf
DOI
10.1109/ISEMC.1991.148195
Filename
148195
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