• DocumentCode
    3556156
  • Title

    Structure-dependent MOSFET degradation due to hot-electron injection

  • Author

    Hsu, Fu-Chieh ; Grinolds, Hugh R.

  • Author_Institution
    Hewlett-Packard Laboratories, Palo Alto, California
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    742
  • Lastpage
    744
  • Keywords
    Degradation; Electrodes; Equivalent circuits; Interface states; Laboratories; MOSFET circuits; Maintenance; Secondary generated hot electron injection; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190616
  • Filename
    1483741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3556156