• DocumentCode
    3556398
  • Title

    Promissing new fabrication process developed for stacked LSI´s

  • Author

    Yasumoto, M. ; Hayama, H. ; Enomoto, T.

  • Author_Institution
    NEC Corporation
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    816
  • Lastpage
    819
  • Abstract
    A stacked CMOS LSI fabrication process has been developed for the purpose of realizing a short fabrication turn-around time, high fabrication yield and high integration density. This process consists of, in addition to the conventional LSI process, fabrication of vertical interconnections, surface planarization and thermal compression to obtain electrical interconnections between 2 layers. A 2-layer, bulk/CMOS ring oscillator consisting of p-channel MOSFETs on the upper layer and n-channel MOSFETs on the lower layer has been made using this new fabrication process. It has 31 bulk/CMOS inverter stages, each of which contains a single Au vertical interconnection with area of 10 × 10 µm2. A typical propagation delay time per stage for this device is measured to be 1.86 nsec at a supply voltage of 5 V.
  • Keywords
    CMOS process; Fabrication; Gold; Inverters; Large scale integration; MOSFETs; Planarization; Propagation delay; Ring oscillators; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190852
  • Filename
    1484623