• DocumentCode
    3556582
  • Title

    Session 21 Hot carrier effects in MOS for VLSI

  • Author

    Troutman, R.

  • Author_Institution
    IBM Corporation, Essex Junction, VT
  • fYear
    1985
  • fDate
    1-4 Dec. 1985
  • Firstpage
    551
  • Lastpage
    551
  • Abstract
    Start of the above-titled section of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1985 International
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1985.191028
  • Filename
    1485578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3556582