DocumentCode
3556822
Title
Session 24 Device modeling beyond drift-plus-diffusion transport
Author
Laux, S.E.
Author_Institution
IBM T.J. Watson Research Center, Yorktown Heights, NY
fYear
1986
fDate
7-10 Dec. 1986
Firstpage
553
Lastpage
553
Abstract
Start of the above-titled section of the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1986 International
Conference_Location
Los Angeles, CA, USA
Type
conf
DOI
10.1109/IEDM.1986.191247
Filename
1486505
Link To Document