DocumentCode
3557148
Title
Session 28 Modeling and simulation — MOS modeling
Author
Pinto, M. ; Blakey, P.
Author_Institution
AT&T Bell Laboratories
fYear
1987
fDate
6-9 Dec. 1987
Firstpage
627
Lastpage
627
Abstract
Start of the above-titled section of the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1987 International
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/IEDM.1987.191505
Filename
1487463
Link To Document