• DocumentCode
    3557479
  • Title

    20V Asymmetric Complementary Power Device Implementation within a 0.25um CMOS Technology for Power Management

  • Author

    Letavic, T. ; Cook, R. ; Brock, R. ; Effing, H. ; Einerhand, R.

  • Author_Institution
    Philips Semicond., Hopewell Junction, NY
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    367
  • Lastpage
    370
  • Abstract
    This paper presents a process flow in which a 20V-class of power devices is added to baseline 0.25mum CMOS technology by forming asymmetric extended-drain device structures in which shallow-trench-isolation (STI) is incorporated within the device unit cell, forming a gate extended-drain dielectric region. The Rsp-BVds figure-of-merit is consistent with best-in-class for this device construction (0.16 mOhm cm2/24V), and the isolated high-voltage diode capability make this process cost-effective for implementation of mobile power management circuit topologies, including multiple-output DC-DC converters, battery chargers, linear regulators, audio power amplifiers, and white-light backlighting systems
  • Keywords
    CMOS integrated circuits; isolation technology; power integrated circuits; semiconductor technology; 0.25 micron; CMOS integrated circuits; asymmetric complementary power device; asymmetric extended-drain device structures; gate extended-drain dielectric region; isolated high-voltage diode capability; isolation technology; mobile power management circuit topologies; power integrated circuits; power management application; shallow-trench-isolation; Battery management systems; CMOS process; CMOS technology; Circuit topology; DC-DC power converters; Dielectric devices; Diodes; Energy management; Power system management; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-8890-9
  • Type

    conf

  • DOI
    10.1109/ISPSD.2005.1488027
  • Filename
    1488027