• DocumentCode
    3558233
  • Title

    Long-wavelength PbSnTe-PbTeSe lattice-matched single-heterestructure lasers grown by LPE

  • Author

    Zussman, A. ; Eger, D. ; Oron, M. ; Szapiro, S. ; Shachna, A. ; Hans, B.

  • Author_Institution
    Soreq Nuclear Research Centre, Physics Department, Yavne, Israel
  • Volume
    129
  • Issue
    6
  • fYear
    1982
  • fDate
    12/1/1982 12:00:00 AM
  • Firstpage
    203
  • Lastpage
    207
  • Abstract
    Properties of Pb1 ¿ xSnxTe-PbTe1¿ySey lattice-matched single-heterostructure (SH) diode lasers grown on Pb1 ¿ xSnxTe substrates by liquid-phase epitaxy were studied for various compositions in the range 0.13<x<0.24, which corresponds to a wavelength range of 12 ¿m to 18.5 ¿m (at T = 20K). Threshold current density Jth was measured as a function of temperature from 10K to 140K, and was found to be comparable to that observed previously in PbSnTe-PbTeSe and PbSnTeSe-PbTeSe DH lasers. An external differential quantum efficiency of 1¿2% was measured in these lasers. The emission spectra of the SH lasers frequently show a single-mode structure for J<2Jth at high temperatures. Measurements of I/V characteristics carried out in these lasers suggest that tunnelling currents contribute significantly to the observed threshold current density. At high temperatures, characteristic temperatures To in the range 16.5 to 21 K were measured.
  • Keywords
    IV-VI semiconductors; lead compounds; liquid phase epitaxial growth; semiconductor growth; semiconductor junction lasers; tellurium compounds; tin compounds; 1.2 to 18.5 micron wavelength range; 10K to 140K; I/V characteristics; LPE; Pb1-xSnxTe-PbTe1-ySey; PbSnTe-PbTeSe; SH lasers; diode lasers; emission spectra; external differential quantum efficiency; lattice-matched single-heterostructure lasers; liquid-phase epitaxy; semiconductor laser; single-mode structure; threshold current density; tunneling currents;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    12/1/1982 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1982.0047
  • Filename
    4642648