Surface-Response-Based Modeling of Digitizers: A Case Study on a Fast Digital Integrator at CERN

Author

Arpaia, Pasquale ; Inglese, Vitaliano ; Spiezia, Giovanni ; Tiso, Stefano

Author_Institution

Dept. of Eng., Univ. of Sannio, Benevento

Volume

58

Issue

6

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

1919

Lastpage

1928

Abstract

A statistical approach to simulation in behavioral modeling for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on a statistical experimental design allows operating conditions to be systematically and comprehensively explored, simulation to be optimized, and identification and validation uncertainty to be verified. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at the European Organization for Nuclear Research (CERN) is presented.

Keywords

design of experiments; digital integrated circuits; CERN; behavioral modeling; dynamic metrological performance; fast digital integrator; statistical approach; statistical experimental design; surface-response-based digitizer modeling; validation uncertainty; Analog-to-digital conversion (ADC); error analysis; identification; modeling; statistics;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

Conference_Location

10/14/2008 12:00:00 AM

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2008.2005855

Filename

4652561