DocumentCode
355895
Title
Thermal modeling and experimental validation of thermal interface performance between non-flat surfaces
Author
Chiu, Chia-Pin ; Solbrekken, Gary L. ; Young, Todd M.
Author_Institution
Intel Corp., Chandler, AZ, USA
Volume
1
fYear
2000
fDate
2000
Lastpage
62
Abstract
Thermal interface materials (TIMs) are commonly used to reduce the thermal resistance between an electronic device and its cooling solution. The thermal performance of a TIM is very sensitive to its bond line thickness, and hence, the warpage profiles of the mating surfaces. The contact surfaces are usually never perfectly flat due to the manufacturing process induced warpage in heat sinks and electronic packages. This paper focuses on a simplified numeric approach to simulate thermal performance of a TIM between the non-flat surfaces. This modeling approach uses an “equivalent” thermal conductivity to simulate warpage rather than building actual surface curvature in the model. In order to validate the numerical model, a test apparatus was developed and tooled up to measure the thermal resistance of an aluminum-nitride (AlN) filled thermal grease between the non-flat surfaces. It can be concluded that the simplified numerical approach can efficiently predict the TIM thermal performance between non-flat surfaces. This model can be further extended to the cases with more complicated surface profiles and multiple heat sources
Keywords
cooling; heat sinks; packaging; thermal conductivity; thermal resistance; TIMs; bond line thickness; cooling solution; electronic packages; heat sinks; mating surfaces; multiple heat sources; nonflat surfaces; surface profiles; thermal conductivity; thermal interface performance; thermal modeling; thermal resistance; warpage profiles; Bonding; Electronic packaging thermal management; Electronics cooling; Heat sinks; Manufacturing processes; Numerical models; Numerical simulation; Surface resistance; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1089-9870
Print_ISBN
0-7803-5912-7
Type
conf
DOI
10.1109/ITHERM.2000.866808
Filename
866808
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