• DocumentCode
    3559123
  • Title

    Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification

  • Author

    Bahi, Manoubi Auguste ; Lecuyer, Pascal ; Gentil, Annabelle ; Fremont, H?©l?©ne ; Landesman, Jean-Pierre ; Christien, Fr?©d?©ric ; Gall, Ren?© Le

  • Author_Institution
    Atmel Nantes SA, Nantes
  • Volume
    8
  • Issue
    3
  • fYear
    2008
  • Firstpage
    484
  • Lastpage
    489
  • Abstract
    Several package families used in automotive environment were aged at different high temperatures. The purpose was to better characterize the predominant failure mechanism of ball bonds and to identify the most influential technological parameters on it. The mechanism is related to the Kirkendall effect, which is a consequence of the Au-Al intermetallic phase growth. For identical materials, the package geometry plays a crucial role: experimental results are confirmed by both analytical model and finite-element simulations. To extend the qualification domain to the biggest package size, the wire bonding process must be improved. In particular, the use of Au-1 wt.% Pd instead of pure Au is investigated, showing that this alloy permits to decrease the Au-Al intermetallic growth and, hence, to increase the lifetime.
  • Keywords
    ageing; aluminium alloys; automobile industry; automotive electronics; bonding processes; chemical interdiffusion; electronics packaging; failure analysis; finite element analysis; gold alloys; palladium alloys; Au-Al wire bond; AuAl; AuPdAl; Kirkendall effect; ageing; automotive application; ball bond; degradation mechanism; failure mechanism; finite-element simulation; intermetallic phase growth; package geometry; qualification test; Analytical models; Automotive applications; Automotive engineering; Degradation; Intermetallic; Packaging; Qualifications; Temperature; Testing; Wire; Au–Al wire bond; automotive application; high temperature;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2008.2001703
  • Filename
    4655583