DocumentCode
3559123
Title
Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification
Author
Bahi, Manoubi Auguste ; Lecuyer, Pascal ; Gentil, Annabelle ; Fremont, H?©l?©ne ; Landesman, Jean-Pierre ; Christien, Fr?©d?©ric ; Gall, Ren?© Le
Author_Institution
Atmel Nantes SA, Nantes
Volume
8
Issue
3
fYear
2008
Firstpage
484
Lastpage
489
Abstract
Several package families used in automotive environment were aged at different high temperatures. The purpose was to better characterize the predominant failure mechanism of ball bonds and to identify the most influential technological parameters on it. The mechanism is related to the Kirkendall effect, which is a consequence of the Au-Al intermetallic phase growth. For identical materials, the package geometry plays a crucial role: experimental results are confirmed by both analytical model and finite-element simulations. To extend the qualification domain to the biggest package size, the wire bonding process must be improved. In particular, the use of Au-1 wt.% Pd instead of pure Au is investigated, showing that this alloy permits to decrease the Au-Al intermetallic growth and, hence, to increase the lifetime.
Keywords
ageing; aluminium alloys; automobile industry; automotive electronics; bonding processes; chemical interdiffusion; electronics packaging; failure analysis; finite element analysis; gold alloys; palladium alloys; Au-Al wire bond; AuAl; AuPdAl; Kirkendall effect; ageing; automotive application; ball bond; degradation mechanism; failure mechanism; finite-element simulation; intermetallic phase growth; package geometry; qualification test; Analytical models; Automotive applications; Automotive engineering; Degradation; Intermetallic; Packaging; Qualifications; Temperature; Testing; Wire; Au–Al wire bond; automotive application; high temperature;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2008.2001703
Filename
4655583
Link To Document