• DocumentCode
    3559162
  • Title

    Reliability and Availability in Reconfigurable Computing: A Basis for a Common Solution

  • Author

    Gericota, Manuel G. ; Alves, Gustavo R. ; Silva, Miguel L. ; Ferreira, Jos?©M

  • Author_Institution
    Dept. of Electr. Eng., Polytech. Inst. of Porto, Porto
  • Volume
    16
  • Issue
    11
  • fYear
    2008
  • Firstpage
    1545
  • Lastpage
    1558
  • Abstract
    Dynamically reconfigurable SRAM-based field-programmable gate arrays (FPGAs) enable the implementation of reconfigurable computing systems where several applications may be run simultaneously, sharing the available resources according to their own immediate functional requirements. To exclude malfunctioning due to faulty elements, the reliability of all FPGA resources must be guaranteed. Since resource allocation takes place asynchronously, an online structural test scheme is the only way of ensuring reliable system operation. On the other hand, this test scheme should not disturb the operation of the circuit, otherwise availability would be compromised. System performance is also influenced by the efficiency of the management strategies that must be able to dynamically allocate enough resources when requested by each application. As those resources are allocated and later released, many small free resource blocks are created, which are left unused due to performance and routing restrictions. To avoid wasting logic resources, the FPGA logic space must be defragmented regularly. This paper presents a non-intrusive active replication procedure that supports the proposed test methodology and the implementation of defragmentation strategies, assuring both the availability of resources and their perfect working condition, without disturbing system operation.
  • Keywords
    circuit reliability; field programmable gate arrays; FPGA; SRAM; field-programmable gate arrays; reconfigurable computing systems; resource allocation; Availability; Circuit faults; Circuit testing; Employee welfare; Field programmable gate arrays; Logic; Resource management; Routing; System performance; System testing; Active replication; availability; field-programmable gate array (FPGA); online structural testing; reliability;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2001141
  • Filename
    4655626