DocumentCode
3559162
Title
Reliability and Availability in Reconfigurable Computing: A Basis for a Common Solution
Author
Gericota, Manuel G. ; Alves, Gustavo R. ; Silva, Miguel L. ; Ferreira, Jos?©M
Author_Institution
Dept. of Electr. Eng., Polytech. Inst. of Porto, Porto
Volume
16
Issue
11
fYear
2008
Firstpage
1545
Lastpage
1558
Abstract
Dynamically reconfigurable SRAM-based field-programmable gate arrays (FPGAs) enable the implementation of reconfigurable computing systems where several applications may be run simultaneously, sharing the available resources according to their own immediate functional requirements. To exclude malfunctioning due to faulty elements, the reliability of all FPGA resources must be guaranteed. Since resource allocation takes place asynchronously, an online structural test scheme is the only way of ensuring reliable system operation. On the other hand, this test scheme should not disturb the operation of the circuit, otherwise availability would be compromised. System performance is also influenced by the efficiency of the management strategies that must be able to dynamically allocate enough resources when requested by each application. As those resources are allocated and later released, many small free resource blocks are created, which are left unused due to performance and routing restrictions. To avoid wasting logic resources, the FPGA logic space must be defragmented regularly. This paper presents a non-intrusive active replication procedure that supports the proposed test methodology and the implementation of defragmentation strategies, assuring both the availability of resources and their perfect working condition, without disturbing system operation.
Keywords
circuit reliability; field programmable gate arrays; FPGA; SRAM; field-programmable gate arrays; reconfigurable computing systems; resource allocation; Availability; Circuit faults; Circuit testing; Employee welfare; Field programmable gate arrays; Logic; Resource management; Routing; System performance; System testing; Active replication; availability; field-programmable gate array (FPGA); online structural testing; reliability;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2001141
Filename
4655626
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