• DocumentCode
    3559176
  • Title

    Thermal aging micro-scale analysis of power transformer pressboard

  • Author

    Liao, Rui-jin ; Tang, Chao ; Yang, Li-jun ; Grzybowski, Stanislaw

  • Author_Institution
    State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing
  • Volume
    15
  • Issue
    5
  • fYear
    2008
  • fDate
    10/1/2008 12:00:00 AM
  • Firstpage
    1281
  • Lastpage
    1287
  • Abstract
    In order to analyze the thermal aging mechanism of the insulation paper inside the power transformer, a series of accelerated thermal aging tests were performed on pressboard. Subsequently, the atomic force microscope (AFM) together with scanning electron microscope (SEM) and X-ray diffraction (X-RD) were utilized to observe the micro surface of the thermal-aged pressboard. The experiments and analysis indicate that either the links among the D-glucopyranose units or the hexagonal mesh structures of the D-glucopyranose units were broken under thermal stress; the number of D-glucopyranose units after 6 weeks of aging was 0.8-1 per nm2, only about one third of un-aged value. The wall of a cellulose cell was deteriorated and thinned by thermal stress. At the same time, the cracks expanded gradually on the surface of the cellulose, which shortened the average width of cellulose fiber from about 40 mu of un-aged sample to about 25 mu after 6 weeks of aging. Meanwhile, the relative crystallinity and the size of the crystallite in the pressboard decreased nonlinearly with the thermal aging time.
  • Keywords
    X-ray diffraction; ageing; atomic force microscopy; insulation testing; life testing; natural fibres; paper; power transformer insulation; power transformer testing; scanning electron microscopy; thermal stress cracking; AFM; D-glucopyranose units; SEM; X-ray diffraction; XRD; accelerated thermal aging tests; atomic force microscope; cellulose cell wall; cellulose fiber; cellulose surface; cracks expansion; crystallite size; hexagonal mesh structures; insulation paper; micro-scale analysis; power transformer pressboard; relative crystallinity; scanning electron microscope; thermal stress; time 6 week; Accelerated aging; Atomic force microscopy; Crystallization; Life estimation; Performance analysis; Power transformer insulation; Power transformers; Scanning electron microscopy; Thermal force; Thermal stresses; Thermal aging; X-ray diffraction (XRD); atomic force microscope (AFM); insulation; power transformer; pressboard; scanning electron microscope (SEM);
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    10/1/2008 12:00:00 AM
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2008.4656235
  • Filename
    4656235