• DocumentCode
    3559300
  • Title

    Clarifying the record on testability cost functions

  • Author

    Breuer, Melvin A.

  • Author_Institution
    Univ. of Southern California, Los Angeles, CA
  • Volume
    25
  • Issue
    6
  • fYear
    2008
  • Firstpage
    608
  • Lastpage
    609
  • Abstract
    Many articles have been written on testability cost functions and measures. Most of them point to the work of Lawrence Goldstein as one of the first major contributions in this field.4 In this column, the author describes his personal familiarity with some of this early work in an effort to clarify the genesis of these ideas.
  • Keywords
    automatic test pattern generation; logic gates; logic testing; AND gate; D-algorithm; automatic test pattern generation; testability cost functions; Aircraft; Automatic test pattern generation; Circuit faults; Controllability; Cost function; Flip-flops; Military computing; Testing; Tree data structures; Writing;
  • fLanguage
    English
  • Journal_Title
    Design Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.161
  • Filename
    4702889
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3559300