DocumentCode
3560362
Title
Effect of Slit Patterning Perpendicular to Magnetic Easy Axis in Thin Film Inductors
Author
Masai, Taku ; Kitamoto, Yoshitaka
Author_Institution
Dept. of Innovative & Eng. Mater., Tokyo Inst. of Technol., Ichikawa
Volume
44
Issue
11
fYear
2008
Firstpage
3871
Lastpage
3874
Abstract
In the case of spiral inductors using magnetic thin films with uniaxial anisotropy, magnetic flux pass through both easy and hard axes in the films. Frequency characteristics of inductance in the spiral inductors strongly depend on magnetization behaviors in the magnetic easy-axis direction. Slit patterning perpendicular to the magnetic easy axis in the magnetic thin films influences domain-wall displacement in the easy-axis direction, raising its resonant frequency and improving the permeability in the MHz range. The permeability at 1 MHz in the easy-axis direction takes the maximum value when the wire width is 0.5 mm in the slit-patterned CoZrTa films. Furthermore, also in composite spiral-inductor devices using the slit-patterned CoZrTa films and ferrite substrates, the inductance at 1 MHz takes the maximum value at the same wire width. The slit patterning perpendicular to the magnetic easy axis is effective to achieve high inductance in the MHz range for magnetic thin-film spiral inductors.
Keywords
cobalt alloys; magnetic anisotropy; magnetic domain walls; magnetic permeability; magnetic thin film devices; magnetic thin films; magnetisation; tantalum alloys; thin film inductors; zirconium alloys; CoZrTa; composite spiral-inductor devices; domain-wall displacement; ferrite substrates; frequency 1 MHz; frequency characteristics; magnetic easy axis; magnetic easy-axis direction; magnetic flux; magnetic thin films; magnetic thin-film spiral inductors; magnetization behaviors; permeability; resonant frequency; size 0.5 mm; slit patterning perpendicular; slit-patterned films; uniaxial anisotropy; CoZrTa; domain wall; magnetic thin films; magnetization reversal; permeability;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2008.2002476
Filename
4717725
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