• DocumentCode
    3560365
  • Title

    Transport and Magnetic Properties of CPP-GMR Sensor With CoMnSi Heusler Alloy

  • Author

    Mizuno, Tomohito ; Tsuchiya, Yoshihiro ; Machita, Takahiko ; Hara, Shinji ; Miyauchi, Daisuke ; Shimazawa, Kouji ; Chou, Tsutomu ; Noguchi, Kiyoshi ; Tagami, Katsumichi

  • Author_Institution
    Adv. Head Dev. Group, TDK Corp., Nagano
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    3584
  • Lastpage
    3587
  • Abstract
    We investigated structural and magnetic properties of CoMnSi (CMS) Heusler alloy films and giant magneto-resistance (GMR) ratio of current-perpendicular-to-plane (CPP) GMR sensor elements. The films were deposited with magnetron sputtering method and annealed at 673 K and 773 K. The CMS films were identified as B2 structure by using X-ray diffraction and the magnetization of the films were evaluated as 0.95 T. We fabricated the CPP-GMR sensors varying the composition of the CMS films, Co48 Mn21 Si31 (at. %) as Si-rich CMS and Co51Mn25Si24 (at. %) as CMS-ref, having a FeCo layer between the CMS and Cu spacer. It was found that the element with Si-rich CMS exhibited higher GMR ratio of 9.0% than that with CMS-ref. Our calculations indicate that larger spin polarization of contact region between the CMS film and the FeCo film relates to larger GMR ratio.
  • Keywords
    X-ray diffraction; cobalt alloys; giant magnetoresistance; magnetic sensors; magnetic thin film devices; magnetisation; magnetoresistive devices; manganese alloys; silicon alloys; spin polarised transport; sputter deposition; Co45Mn21Si31; Cu; FeCo; Heusler alloy films; X-ray diffraction; current-perpendicular-to-plane GMR sensor elements; giant magnetoresistance ratio; magnetization; magnetron sputtering method; spin polarization; temperature 673 K; temperature 773 K; Current-perpendicular-to-plane (CPP); Heusler alloys; giant magneto-resistance (GMR); magnetic recording;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2001655
  • Filename
    4717728