DocumentCode
3561626
Title
A novel fault diagnosis based on wavelet transform of Iddt waveform
Author
Zhou Jianmin ; Hongbing, Xu ; Houjun, Wang
Author_Institution
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
2
fYear
2004
Firstpage
1320
Abstract
A novel fault diagnosis algorithm based on Iddt is presented in this paper. A fault curve which contains all kinds of fault feature is used to diagnose the fault. Three methods have been employed to process the fault curve. Simulation experiments have been used to illuminate the effectiveness of the algorithms.
Keywords
electric current measurement; fault simulation; integrated circuit testing; wavelet transforms; Iddt waveform; fault curve; fault diagnosis algorithm; wavelet transform; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit testing; Neural networks; Signal analysis; Voltage; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN
0-7803-8647-7
Type
conf
DOI
10.1109/ICCCAS.2004.1346415
Filename
1346415
Link To Document