DocumentCode
3564607
Title
Parametric model extraction for MEMS based on variational finite element techniques
Author
Mehner, Jan E. ; Schaporin, Alexey ; Kolchuzhin, Vladimir ; Doetzel, Wolfram ; Gessner, Thomas
Author_Institution
Dept. Micro Devices & Equip., Fraunhofer Inst. for Reliability & Microintegration, Germany
Volume
1
fYear
2005
Firstpage
776
Abstract
This article is focused on new finite element technologies which account for parameter variations in a single finite element run. The key idea of the new approach is to compute not only the governing system matrices of the FE problem but also n high order partial derivatives with regard to design parameters by means of automatic differentiation (AD). As result, Taylor vectors of the system´s response can be expanded in the vicinity of the initial position capturing dimensions and physical parameter. Essential speed-up can be achieved for shape optimization, sensitivity analyses and data sampling needed for reduced order modeling of MEMS.
Keywords
differentiation; finite element analysis; micromechanical devices; partial differential equations; reduced order systems; variational techniques; FE system matrices; MEMS parametric model extraction; Taylor series expansion; automatic differentiation; data sampling; high order partial derivatives; reduced order modeling; sensitivity analyses; shape optimization; system response Taylor vectors; variational finite element techniques; Capacitive sensors; Electromagnetic devices; Electromagnetic fields; Finite element methods; Micromechanical devices; Parametric statistics; Precision engineering; Reduced order systems; Sensitivity analysis; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN
0-7803-8994-8
Type
conf
DOI
10.1109/SENSOR.2005.1496532
Filename
1496532
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