DocumentCode
3565101
Title
High performance silicon imaging arrays for cosmology, planetary sciences, & other applications
Author
Nikzad, Shouleh ; Hoenk, Michael E. ; Hennessy, John ; Jewell, April D. ; Carver, Alexander G. ; Jones, Todd J. ; Cheng, Samuel L. ; Goodsall, Timothy ; Shapiro, Charles
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2014
Abstract
High performance back-illuminated silicon arrays processed with precision atomic control of surface and interfaces are described. Precision atomic control of surface and interfaces parameters dictates quantum efficiency (QE), surface generated dark current, and cosmetic characteristics. Molecular Beam Epitaxy is used to grow delta layers and superlattice structures on the back surface of Si arrays. Photoelectron loss is greatly reduced and near 100% internal QE achieved. Photon losses are reduced by interface engineering using atomic layer deposition. Using these surface and interface treatments in different readout structures and formats creates a suite of devices with many applications. Si detectors spanning planetary science, astrophysics, medical diagnostics, machine vision, and commercial applications will be described.
Keywords
atomic layer deposition; cosmology; elemental semiconductors; image sensors; molecular beam epitaxial growth; semiconductor superlattices; sensor arrays; silicon; surface treatment; QE; Si; astrophysics; atomic layer deposition; back-illuminated silicon imaging array; commercial application; cosmetic characteristics; cosmology application; delta layer; interface treatment; machine vision; medical diagnostics; molecular beam epitaxial growth; photoelectron loss; photon loss; precision surface atomic control; quantum efficiency; readout structure; spanning planetary science application; superlattice structure; surface generated dark current; surface treatment; Atomic layer deposition; CMOS integrated circuits; Coatings; Detectors; Imaging; Silicon; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2014 IEEE International
Type
conf
DOI
10.1109/IEDM.2014.7047027
Filename
7047027
Link To Document