DocumentCode
3565122
Title
Progressive vs. abrupt reset behavior in conductive bridging devices: A C-AFM tomography study
Author
Celano, U. ; Goux, L. ; Belmonte, A. ; Giammaria, G. ; Opsomer, K. ; Detavernier, C. ; Richard, O. ; Bender, H. ; Irrera, F. ; Jurczak, M. ; Vandervorst, W.
Author_Institution
Imec, Leuven, Belgium
fYear
2014
Abstract
We investigated the physical origin of progressive and abrupt reset in conductive bridging memories. The conductive filaments for both types of reset are observed in 3D using C-AFM tomography, enabling the observation of broken and non-broken filaments respectively for abrupt and progressive reset.
Keywords
atomic force microscopy; random-access storage; C-AFM tomography; CBRAM; abrupt reset behavior; broken filament; conductive bridging device; conductive filament; nonbroken filament; progressive reset behavior; Aluminum oxide; Electrodes; Materials; Switches; Three-dimensional displays; Tomography; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2014 IEEE International
Type
conf
DOI
10.1109/IEDM.2014.7047048
Filename
7047048
Link To Document