DocumentCode
3565302
Title
Multiple breakdown phenomena and modeling for non-uniform dielectric systems
Author
Wu, Ernest ; Baozhen Li ; Stathis, James H. ; Achanta, Ravi
Author_Institution
IBM Co. SRDC, Essex Junction, VT, USA
fYear
2014
Abstract
We report a wide range of experimental observations of multiple breakdown (BD) phenomena in BEOL/FEOL/MOL dielectric systems with large variability (non-uniformity). Newly developed successive breakdown theory of time-dependent clustering model can well capture these multiple BD events with and without correlation. The understanding of these effects can potentially lead to much improved and realistic projection for future technology nodes.
Keywords
electric breakdown; statistical analysis; BEOL dielectric systems; FEOL dielectric systems; MOL dielectric systems; multiple breakdown phenomena; nonuniform dielectric systems; successive breakdown theory; time-dependent clustering model; Correlation; Data models; Dielectrics; Electric breakdown; Mathematical model; Reliability; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2014 IEEE International
Type
conf
DOI
10.1109/IEDM.2014.7047171
Filename
7047171
Link To Document