• DocumentCode
    3565302
  • Title

    Multiple breakdown phenomena and modeling for non-uniform dielectric systems

  • Author

    Wu, Ernest ; Baozhen Li ; Stathis, James H. ; Achanta, Ravi

  • Author_Institution
    IBM Co. SRDC, Essex Junction, VT, USA
  • fYear
    2014
  • Abstract
    We report a wide range of experimental observations of multiple breakdown (BD) phenomena in BEOL/FEOL/MOL dielectric systems with large variability (non-uniformity). Newly developed successive breakdown theory of time-dependent clustering model can well capture these multiple BD events with and without correlation. The understanding of these effects can potentially lead to much improved and realistic projection for future technology nodes.
  • Keywords
    electric breakdown; statistical analysis; BEOL dielectric systems; FEOL dielectric systems; MOL dielectric systems; multiple breakdown phenomena; nonuniform dielectric systems; successive breakdown theory; time-dependent clustering model; Correlation; Data models; Dielectrics; Electric breakdown; Mathematical model; Reliability; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2014 IEEE International
  • Type

    conf

  • DOI
    10.1109/IEDM.2014.7047171
  • Filename
    7047171