• DocumentCode
    3565847
  • Title

    MRC training vs. board defect

  • Author

    Lai, Dirack ; Chen, Arthur ; Li, Y.L.

  • Author_Institution
    Data Center Platform Applic. Eng., Intel Asia-Pacific R&D Ltd., Taipei, Taiwan
  • fYear
    2014
  • Firstpage
    81
  • Lastpage
    83
  • Abstract
    Using debug experiments to prove the concept, we correlated failures in the MRC training log with board defects and, in doing so, established a new usage model for MRC board defect capture flow/methodology. We helped customers identify board defect locations by conducting PCB cross-sectional analysis at those locations. This resulted in PCB vendor process improvement by avoiding random board defects. Our MRC training analysis for board defect capturing on DDR nets can apply to any DDR relative design, especially those designs with DRAM chips device down. This methodology/flow fits into the validation process during both production and post-production. It helps customers avoid the high cost of product callback and penalty. The main difficulty is in convincing PCB vendors to do PCB cross-sectional analysis themselves to identify defects in their manufacturing process.
  • Keywords
    DRAM chips; printed circuit testing; DDR nets; DDR relative design; DRAM chips device down; MRC board defect capture flow; MRC training log; PCB cross-sectional analysis; PCB vendor process improvement; board defect capturing; board defect location identification; debug experiments; manufacturing process; memory reference code; random board defects; usage model; Built-in self-test; Integrated circuit interconnections; Mobile handsets; Production; Random access memory; Reliability; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
  • Type

    conf

  • DOI
    10.1109/IMPACT.2014.7048403
  • Filename
    7048403