• DocumentCode
    3568395
  • Title

    Functional Test Pattern Generation For Asynchronous Circuits

  • Author

    Yau-Hwang Kuo ; Bin-Da Liu

  • fYear
    1993
  • Firstpage
    1519
  • Lastpage
    1522
  • Keywords
    Asynchronous circuits; Binary decision diagrams; Circuit faults; Circuit testing; Disk drives; Logic circuits; Machine vision; Signal generators; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    692947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3568395