HSpeedEx: a high-speed extractor for substrate noise analysis in complex mixed-signal SOC

The unprecedented impact of noise coupling on mixed-signal systems-on-a-chip (MS-SOC) functionality, brings a new set of challenges for electronic design automation (EDA) tool developers. In this paper, we propose a new approach which combines a thorough physical comprehension of the noise coupling effects with an improved boundary-element-method (BEM) to accelerate the substrate model extraction and to avoid the dense matrix storage. The low computational efforts required, as well as speed and accuracy reached, makes this method a highly promising alternative to verify complex MS-SOCs.