• DocumentCode
    3572739
  • Title

    Influence of Excitonic Scattering on Charge Carrier Ambipolar Diffusion in Silicon

  • Author

    Velmre, Enn ; Udal, Andres

  • Author_Institution
    Tallinn Technical University, Estonia
  • fYear
    1997
  • Firstpage
    212
  • Lastpage
    215
  • Keywords
    Charge carrier density; Charge carrier processes; Charge carriers; Current density; Electron mobility; Excitons; Impurities; Light scattering; Particle scattering; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194403
  • Filename
    1503333
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3572739