• DocumentCode
    3574971
  • Title

    Design of a long range bidirectional MEMS scanner for a tunable 3D integrated Mirau interferometer

  • Author

    Wei Xu ; Bosseboeuf, Alain ; Parrain, Fabien ; Martincic, Emile

  • Author_Institution
    Inst. d´Electron. Fondamentale, Univ. Paris Sud, Orsay, France
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Mirau interferometers are two beam interferometers with coaxial optical beams that are widely used in full-field optical surface profilers. An integrated Mirau interferometer with a MEMS mirror scanner is proposed in this paper. The novelty of the scanner design is the use of self-aligned vertical electrostatic combs made in double SOI wafer technology which allows a large range, bidirectional, and symmetric vertical translation of the reference mirror. Electrostatic and mechanical analytical calculations and Finite Element Modeling simulations were carried out to design and optimize the MEMS scanner. A large bidirectional range (+/-20 μm) motion under 60V applied voltage is achievable. Good flatness of the reference mirror is preserved during motion, what is essential for interferometrie measurements. A fabrication process which minimizes the number of mask levels is proposed. It is based on front and back side Deep Reactive Ion Etching and dry film photoresist lithographic steps.
  • Keywords
    circuit tuning; finite element analysis; light interferometers; microfabrication; micromechanical devices; micromirrors; photoresists; silicon-on-insulator; sputter etching; MEMS mirror scanner; SOI wafer technology; coaxial optical beam; deep reactive ion etching; dry film photoresist lithographic step; fabrication process; finite element modeling simulation; full-field optical surface profiler; interferometric measurement; long range bidirectional MEMS scanner; microelectromechanical system; self-aligned vertical electrostatic comb; silicon on insulator; tunable 3D integrated Mirau interferometer; two beam interferometer; Electrostatics; Fabrication; Fingers; Micromechanical devices; Optical interferometry; Silicon; Springs; 3D integration; MEMS scanner; Mirau interferometer; vertical combs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014 Symposium on
  • Print_ISBN
    978-2-35500-028-7
  • Type

    conf

  • DOI
    10.1109/DTIP.2014.7056655
  • Filename
    7056655